Reliability and Resiliency of Advanced Electronic
and Nano-Devices
27th August 2009, 9:45 am
ELMOS Semiconductor AG
09:45 Opening - Ulrich Hilleringmann/Bernd Burchard
10:00 Variability, Aging, and Compensation Techniques in sub-100nm CMOS - Christian Pacha
10:45 From more Moore to more than Moore - Mladen Berekovic
11:30 Radiation Effects, in consumer and aerospace applications - Gilson Wirth
12:15 lunchtime
13:15 Nanoelectronics Devices-Small is Beautifull? - Joachim Knoch
14:00 Voting Strategies for Highly Redundant Processing Elements - Klaus Echtle
14:45 Field Effect Transistors with Organic Semiconductors and Nanoscale Semiconductor Particles - Ulrich Hilleringmann
15:30 Sub-nm-Lithography with single atoms for room temperature quantum computing - Jan Meijer
16:15 Discussion
Registration: schleghuber@sensorik.upb.de